8th European Conference on Residual Stress
On June 26-28, 2010 at Riva del Garda (TN), Italy
ECRS8 is the forum where the main advancements and new results in residual stress determination and modelling are presented and discussed among the main experts in this field.

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Simple and intuitive interface for the full control of the diffractometer.


Xenia offers a convenient and flexible environment for XRD quantitative phase analysis and Rietveld crystallographic refinement. An intuitive user interface hides the complexity of the mathematical and physical models during routine analysis, while offering to advanced users the power and flexibility of a full Rietveld parametric engine.