At present the
aim is the development of new
methodologies and instrumentation in the
material science field, using X-ray
diffraction and X-ray fluorescence
techniques.
Xenia offers a convenient and flexible environment for quantitative phase analysis and Rietveld crystallographic refinement. An intuitive user interface hides the complexity of the mathematical and physical models during routine analysis, while offering to advanced users the power and flexibility of a full Rietveld parametric engine.
