X-Ray Diffraction (XRD) methods of stress measurement have been widely used in the last years, in automotive, in aerospace and in many other industrial applications.
Among the non-destructive methods, XRD is the most accurate and best developed: for this reason the interest in the use of XRD stress analysis for the control of the surface treatments is increasing.
No matter how big the sample is: ENIXE is small, compact and portable and ensures an accurate and quick analysis.
The control of the shot peening, for example, can easily obtained by measuring the subsurface residual stress distributions produced: few minutes of measurement are enough for determining the stress components in the desired point.
The user can move the instrument over the sample;
the correct alignment is easily obtained thanks to
laser beams; once the head of the goniometer is
placed at the correct height the measurement starts
and in few minutes the analysis allows the
determination of the residual stress in the chosen
point.The user can also select one or more
measurement directions (! plane) in order to
improve the quality of the achievable information.
The X-ray spot on the sample can be changed
replacing the collimator, according to the
curvature and the grain size of the sample.
Wavelength |
CrKa |
Range Psi |
from -45 to +45 deg |
Range Phi |
from 0 to 360 deg |
Detector |
solid state |
Sample alignment |
laser controlled |
Analysis |
biaxial, stress tensor, sin2Psi method, elastic constants determinationc |
Collimators |
cylindric; 1 mm, 2 mm, 3 mm; other diameters available |